Every part that Tekmos manufacturers, has to be tested. The wafer manufacturing process will naturally produce a percentage of non-functional parts, and we must identify them and reject them. Tekmos uses a combination of inside and outside test resources to test the parts. Tekmos has experienced sizable growth over the last two years, and as a result, we were finding ourselves limited by our test capacity. To address this, we decided to buy additional testers to augment the two testers we already had.
Purchasing a tester is a complicated decision. You need to determine how many pins the tester will need. Most of our devices have less than 100 pins, though some have 356 pins. Since tester cost is generally a linear function of pin count, it is important to buy the right amount of pin capacity. You must also consider the economic tradeoffs of tester speed and vector memory capacity.
After months of internal deliberations, we decided to purchase a new Griffin III tester from HiLevel. This tester has 128 pins with a 64M vector depth and a 100 MHz clock rate. This is a significant increase in our capability, since our older testers were limited to 40 MHz and 8M of vector depth.
While we were negotiating over the Griffin II tester, we found another HiLevel on the surplus market. This one was a model ETS780 tester, with 256 pins and an 8M vector depth. It is a much older tester, but was a valuable at a reasonable price, so we acquired it as well.
Along with the testers, we have acquired a new problem. Each tester has a different mechanical interface. In the past, we have just built a custom interface for a specific part to connect to a specific tester. However, this approach has caused capacity problems as our volume has increased. We frequently find ourselves in a situation where we need two different parts that are only testable on a single tester. This results in the situation where one tester is running two shifts, while an adjacent tester is standing unused.